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Description

Models for predicting interconnect and intermeta1lic contact reliability under arbitrary current waveforms have been developed [1-3]. These models are incorporated in the Circuit Electromigration Simulator module in BErkeley Reliability Tool (BERT). The simulator can (1) generate layout advisory for width and length of each interconnect, the safety factor of each contact and via in a circuit to meet user-specified reliability requirements and (2) estimate the overall circuit electromigration failure rate and/or cumulative failure percent of a layout design.

Details

Title
BERT--Circuit Electromigration Simulator
Creator
Computer Science Division, Publisher
Hu, C., Author
Liew, B.K., Author
Fang, P., Author
Published
1990-01-01
Full Collection Name
Electrical Engineering & Computer Sciences Technical Reports
Other Identifiers
ERL-90-3
Type
Text
Format
technical reports
Extent
68 p
Archive
The Engineering Library
Usage Statement
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