Details
Title
Berkeley CMOS Process Test Patterns
Creator
Sheu, B.J., Author
Neureuther, A.R., Author
Oldham, W.G., Author
Shacham, Y., Author
Chen, I-C, Author
Childers, B., Author
Chin, M.J., Author
Choi, J.Y., Author
Chuh, T. Y-H, Author
Fan, L-S, Author
Galewski, C.J., Author
Giocclea, J.I., Author
Crimm, M.A., Author
Hijab, R.S., Author
Hsu, I-S, Author
Lee, J., Author
Lester, S., Author
Liang, M-S, Author
McKinley, H.M., Author
Monteverde, R.J., Author
Pai, P-L, Author
Pierret, J.R., Author
Spickelmier, R.L., Author
Toh, K-Y, Author
Tzeng, C-P J., Author
Wicher, P.J., Author
Wu, A. T-T, Author
Young, K-L, Author
Neureuther, A.R., Author
Oldham, W.G., Author
Shacham, Y., Author
Chen, I-C, Author
Childers, B., Author
Chin, M.J., Author
Choi, J.Y., Author
Chuh, T. Y-H, Author
Fan, L-S, Author
Galewski, C.J., Author
Giocclea, J.I., Author
Crimm, M.A., Author
Hijab, R.S., Author
Hsu, I-S, Author
Lee, J., Author
Lester, S., Author
Liang, M-S, Author
McKinley, H.M., Author
Monteverde, R.J., Author
Pai, P-L, Author
Pierret, J.R., Author
Spickelmier, R.L., Author
Toh, K-Y, Author
Tzeng, C-P J., Author
Wicher, P.J., Author
Wu, A. T-T, Author
Young, K-L, Author
Published
March (Revised June) 1984
Full Collection Name
Electrical Engineering & Computer Sciences Technical Reports
Other Identifiers
ERL-m-84-26
Type
Text
Format
Archive
The Engineering Library
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Collection