A Circuit Aging Simulator (CAS) has been developed as part of the Berkeley Reliability Tools (BERT) to predict the effects of hot-electron degradation on circuit behavior. Using the SPICE2 or SPICE3 circuit simulator, CAS simulates circuit behavior at a user-specified future time point using fresh and pre-stressed model parameter files. CAS is configured in a pre- and post-processor configuration so that no modifications to the SPICE code is necessary. An accompanying UNIX shell script has been developed for user-friendliness and automation so that iterative simulation can easily be done to take into account the effects of on-going degradation.
Title
BERT - CIRCUIT AGING SIMULATOR (CAS)
Published
1990-01-01
Full Collection Name
Electrical Engineering & Computer Sciences Technical Reports
Other Identifiers
ERL-90-2
Type
Text
Extent
68 p
Archive
The Engineering Library
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